NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Yb/Si

ytterbium/silicon

7440-21-3

element, lanthanide, rare earth

Citation:

Author Name(s):

Wigren C., Andersen J.N., Nyholm R., Karlsson U.O., Nogami J., Baski A.A., et al.

Journal:

Phys. Rev. B 47, 9663

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS2-2p_3/2

Surface Core-Level Shift (eV) for the second Layer of Atoms

0.20

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.28

Lorentzian Width (eV):

0.11

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

110, 130

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

0.17 ML Yb/Si(111)-(3x2) and 0.5 ML Yb/Si(111)-(2x1). The Si(111) wafer was cleaned by flashing to ~ 1423 K. Peak locations: Voigt function.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300