NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(P(C₆H₅)₄)₂W(CN)₆O

XPS Formula:

nitrogen atom in axial cyano ligand (trans to oxo ligand)

Name:

bis(tetraphenylphosphonium) hexacyanooxotungstate(VI)

CAS Registry No:

Class:

(iso)cyanide, oxygen ligand, phenyl benzene, phosphonium

Citation:

Author Name(s):

Sieklucka B., Dziembaj R., Witkowski S.

Journal:

Inorg. Chim. Acta 187, 5

DOI:

Pub Year:

1991

bookAll Records in this Publication

Data Processing:

Photoelectron Line

399.40

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.7

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was deposited from CH3CN or CH3OH solutions by evaporation of the solvent. The relative intensity was 0.160.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

170