NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Yb/Mo

ytterbium/molybdenum

7440-64-4

element

Citation:

Author Name(s):

Badenbach M., Hohr A., Laubschat C., Kaindl G., Methfessel M.

Journal:

Phys. Rev. B 50, 14446

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f_5/2

Surface Core-Level Shift (eV)

0.45

Energy Uncertainty:

0.03

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

25-45

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

~ 100 A Yb(111)/Mo(110). The spectra were recorded at normal emission. The thickness was measured using a quartz-crystal thickness monitor.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

300