NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

TiO₂

titanium(IV) dioxide

13463-67-7

catalyst, IV-VI semiconductor, mineral, oxide

Citation:

Author Name(s):

Aas N., Pringle T.J., Bowker M.

Journal:

J. Chem. Soc. Faraday Trans. 90, 1015

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Data Type:

Doublet Separation for Photoelectron Lines

Line Designation:

DS-2p

Double Separation (eV)

5.70

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The composition determined by XPS was TiO1.7. The sample was annealed at 773 K in vacuum. Emission angle = 45 degrees.

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300