NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Si:H

silicon hydrogen

hydride

Citation:

Author Name(s):

Gat E., El Khakani M.A., Chaker M., Jean A., Boily S., Pepin H., et al.

Journal:

J. Mater. Res. 7, 2478

DOI:

Pub Year:

1992

bookAll Records in this Publication

Data Processing:

Photoelectron Line

98.90

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Argon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The surface was cleaned by Ar+ ion bombardment (Ep = 2 keV, j = 5 microamperes cm-2, time = 30 min).

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300