NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

MgTe

magnesium telluride

chalcogenide, II-VI semiconductor, telluride

Citation:

Author Name(s):

Wang M.W., Swenberg J.F., Phillips M.C., Yu E.T., McCaldin J.O., Grant R.W., et al.

Journal:

Appl. Phys. Lett. 64, 3455

DOI:

Pub Year:

1994

book All Records in this Publication

Data Processing:

Photoelectron Line

88.16

0.05

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Peak locations: Voigt function.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300