NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 8

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

GaN

157.70

GaN

3p_1/2

106.30

GaN

3p_3/2

102.60

GaN

17.10

GaN

14.20

AlN

115.60

AlN

70.60

AlN

14.50

Data Processing:

Photoelectron Line

157.70

0.2

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

Al/Mg

X-ray Energy:

Overall Energy Resolution (eV):

0.3

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

n-type GaN. The samples investigated were grown on (0001) 6H-SiC and (0001) saphire substrates in an electron cyclotron resonance, and are of wurtzite crystal structure.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300