NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Si/(CH₃(CH₂)₁₆C(O)O)₂Cd

Name:

silicon/cadmium stearate

CAS Registry No:

7440-21-3

Class:

element, organic acid, oxide

Citation:

Author Name(s):

Marshbanks T.L., Jugduth H.K., Delgass W.N., Franses E.I.

Journal:

Thin Solid Films 232, 126

DOI:

Pub Year:

1993

bookAll Records in this Publication

Data Processing:

Photoelectron Line

98.80

0.2

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Ag,Cu = 84.00,368.27,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Langmuir-Blodgett film. Emission angle = 60 degrees.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):