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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Si
Formula:
Si/(CH3(CH2)16C(O)O)2Cd
Name:
silicon/cadmium stearate
CAS Registry No:
7440-21-3
Class:
element, organic acid, oxide

Citation:
Author Name(s):
Marshbanks T.L., Jugduth H.K., Delgass W.N., Franses E.I.
Journal:
Thin Solid Films 232, 126
DOI:
Pub Year:
1993

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV)
103.00
Energy Uncertainty:
0.3
Background Subtraction Method:
other
Peak Location Method:
other type of curve fit
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Ag,Cu = 84.00,368.27,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Langmuir-Blodgett film. Emission angle = 60 degrees.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
77
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