NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

(CH₃(CH₂)₁₈C(O)O)₃Y

yttrium arachidate

organic acid

Citation:

Author Name(s):

Johnson D.J., Amm D.T., Laursen T., Gupta S.K.

Journal:

Thin Solid Films 232, 245

DOI:

Pub Year:

1993

All Records in this Publication

Data Processing:

Photoelectron Line

3d_5/2

158.23

0.05

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.7

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

50 ML yttrium arachidate were deposited onto n-type Si(100) at 294 K. The film thickness was measured by ellipsometry.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300