NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

tungsten

7440-33-7

element

Citation:

Author Name(s):

Gu C., Olson C.G., Lynch D.W.

Journal:

Phys. Rev. B 48, 12178

DOI:

Pub Year:

1993

book All Records in this Publication

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f_7/2

Surface Core-Level Shift (eV)

-0.45

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

110

Overall Energy Resolution (eV):

0.26

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

W(111). The sample was cleaned by annealing (T ~ 2573 K, time = 10 h). The spectra were recorded at normal emission.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300