NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

Si₃₃O₄₄N₂₂

Name:

silicon oxide nitride (Si33O44N22)

CAS Registry No:

Class:

nitride, oxide

Citation:

Author Name(s):

van Weeren R., Leone E.A., Curran S., Klein L.C., Danforth S.C.

Journal:

J. Am. Ceram. Soc. 77, 2699

DOI:

Pub Year:

1994

bookAll Records in this Publication

Data Processing:

Photoelectron Line

532.20

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au4f7 = 84.00

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

X-ray Diffraction

Specimen Temperature (K):

300