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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:


Tab Page Summary

General:
CH3SH/W
methyl thiolate residing in hollow sites
methanethiol/tungsten
element, thiol

Citation:
Mullins D.R., Lyman P.F.
J. Phys. Chem. 97, 9226
Pub Year:
1993

Data Processing:
Photoelectron Line

Measurement:
Anode Material:
other source
X-ray Energy:
208
Overall Energy Resolution (eV):
0.50
Calibration:
Cu3p, L3MM, 2p3 = 75.14, 334.95, 932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
CH3SH was adsorbed onto W(001) at 100 K and annealed to 250 K. Sulfur coverage is 0.24. The substrate was cleaned by O2 treatment (p = 5E-8 Torr) and heating (T = 1000 - 2300 K).

Specimen:
Method of Determining Specimen Composition:
Auger Electron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
100

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