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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:
Summary Page
Tab Page Summary

General:
Element:
Ni
Formula:
GaNi
Name:
gallium nickel imc
CAS Registry No:
12183-34-5
Class:
intermetallic

Citation:
Author Name(s):
Hsu L.-S., Williams R.S.
Journal:
J. Phys. Chem. Solids 55, 305
DOI:
Pub Year:
1994

Data Processing:
Data Type:
Photoelectron Line
Line Designation:
2p1/2
Binding Energy (eV)
869.80
Energy Uncertainty:
Background Subtraction Method:
other
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):

Measurement:
Use of X-ray Monochromator:
No
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
1.0
Calibration:
Ni2p3 = 852.73
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
The sample was cleaned by cyclic of Ar+ ion bombardment (Ep = 3, 2 and 1 keV, Ip = 20 mA) and annealing (T = 773 K). The composition determined by XPS was Ni0.58Ga0.42.

Specimen:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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