NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Element:

Formula:

(PbO)₅₀(SiO₂)₅₀

Name:

lead oxide silicon dioxide

CAS Registry No:

Class:

glass, silicate

Citation:

Author Name(s):

Wang P.W., Zhang L.P., Lu L., LeMone D.V., Kinser D.L.

Journal:

Appl. Surf. Sci. 84, 75

DOI:

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

531.30

0.05

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

2.91

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

An electron flood gun was used for charge compensation. lead silicate glass

Specimen:

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300