NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

Tab Page Summary

General:

Tl₂S

thallium(I) sulfide

1314-97-2

antimony, chalcogenide, sulfide

Citation:

Author Name(s):

Gheorghiu A., Lampre I., Dupont S., Senemaud C., El Idrissi Raghni M.A.

Journal:

J. Alloys and Compounds 228, 143

DOI:

Pub Year:

1995

bookAll Records in this Publication

Data Processing:

Photoelectron Line

5d_5/2

12.50

Background Subtraction Method:

Shirley

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

1.2

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.8

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The sample was prepared by chemical synthesis from the elements. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300