NIST X-ray Photoelectron Spectroscopy Database

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Total Records: 6

Element

Atomic No

Formula

Spectral Line

Energy (eV)

Details

Lu/W

DS-4f

1.48

Dy/W

SS-4f_7/2

-0.30

Ho/W

SS-4f_7/2

-0.43

Er/W

SS-4f_7/2

-0.39

Eu/W

SS-4f_7/2

-0.48

Lu/W

SS-4f_7/2

-0.53

Data Processing:

Data Type:

Surface Core-level Shift

Line Designation:

SS-4f_7/2

Surface Core-Level Shift (eV)

-0.30

Energy Uncertainty:

0.030

Background Subtraction Method:

other

Peak Location Method:

other type of curve fit

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Measurement:

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.05

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

~ 100 A Dy(0001)/W(110). The thickness was measured using a quartz-crystal thickness monitor. FAT mode.

Specimen:

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

150