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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Pd/Si
Name:
palladium/silicon
CAS Registry No:
7440-21-3
Class:
element, silicide
Author Name(s):
Dai D., Davoli I.
Journal:
Vacuum 46, 139
DOI:
10.1016/0042-207X(95)80070-0
Pub Year:
1995
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
Binding Energy (eV):
99.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Other, Si2p = 99.34
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
50 A Pd/n-type Si(111) with a carrier concentration of 1E15 cm-3.
Specimen:
sputter deposited, thin film
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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