NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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I

CuI

copper(I) iodide

CAS Registry No:

7681-65-4

II-VI semiconductor, iodide

Photoelectron Line

Line Designation:

4d_5/2

Binding Energy (eV):

49.75

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

0.9

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The powder was pressed into In foil. Emission angle = 55 degrees. The intensity ratio of the Gaussian/Lorentzian components was 60/40. FAT mode. The composition determined by XPS was Cu0.516l0.484.

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