NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

Details Summary:

One Page Summary

Instruction: Click on selected Tab for more information.

Element:

Pt/Si

PtSi

platinum/silicon

element, silicide

Ley L., Wang Y., Van V.N., Fisson S., Souche D., Vuye G., et al.

Journal:

Thin Solid Films 270, 561

DOI:

Pub Year:

1995

book All Records in this Publication

Photoelectron Line

4f_7/2

72.50

Background Subtraction Method:

Shirley

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

0.8

Calibration:

Pt4f7 = 71.12

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

150 A/Pt were annealed at 533 K.

Specimen:

annealed, semiconductor, thin layer

Method of Determining Specimen Composition:

X-ray Photoelectron Spectroscopy

Method of Determining Specimen Crystallinity:

Specimen Temperature (K):

300