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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ta
Formula:
TaS
2
Name:
tantalum disulfide
CAS Registry No:
12143-72-5
Class:
chalcogenide, sulfide
Author Name(s):
Aminpirooz S., Becker L., Rossner H., Schellenberger A., Holub-Krappe E.
Journal:
Surf. Sci. 331, 501
DOI:
10.1016/0039-6028(95)00066-6
Pub Year:
1995
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
7/2
Binding Energy (eV):
22.90
Energy Uncertainty:
0.3
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
other source
X-ray Energy:
100
Overall Energy Resolution (eV):
Calibration:
FL = Fermi level
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable (reported energy within 300 eV of a reference energy)
Comment:
2H polytype of TaS2(0001). The Na/Ta composition ratios determined by XPS were 0.03 and 0.12. The spectra were recorded at normal emission.
Specimen:
cleaved crystal, crystal, vacuum cleaved
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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