NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

(^-CH₂C(CH₃)(C(O)OCH₃)^-)n

(^-C(C*H₃)(C(O)^-O^-CH₃)^-C*H₂^-)n

poly(methyl methacrylate)

CAS Registry No:

9011-14-7

ester, oxygen, polymer, sulfur

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

284.80

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.08

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au,Cu = 84.00,932.67

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The composition determined by XPS was C0.740O0.269. The relative intensity is 0.44. An electron flood gun (Ep = 0 eV, Ip = 18 mA) was used for charge compensation. FAT mode. Emission angle = 25 degrees.

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