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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Cu
Formula:
CuInSe
2
Name:
copper indium selenide
CAS Registry No:
12018-95-0
Class:
chalcogenide, II-VI semiconductor, selenide
Author Name(s):
Sobol P.E., Nelson A.J., Schwerdtfeger C.R., Stickle W.F., Moulder J.F.
Journal:
Surf. Sci. Spectra 1, 393
DOI:
10.1116/1.1247633
Pub Year:
1992
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
932.49
Energy Uncertainty:
Background Subtraction Method:
Linear
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
0.99
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
Yes
Anode Material:
Al
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu = 84.00,932.67
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
CuInSe2(112). The composition determined by XPS was Cu0.272In0.352Se0.376. FAT mode. Emission angle = 25 degrees.
Specimen:
cleaved crystal, crystal, semiconductor
Method of Determining Specimen Composition:
X-ray Photoelectron Spectroscopy
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
300
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