NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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O

(^-CH₂CH₂OC(O)C₆H₄C(O)O^-)n

(^-O*^-C(O)^-C₆H₄^-C(O)^-O*^-CH₂^-CH₂^-)n

poly(ethylene terephthalate)

CAS Registry No:

25038-59-9

carboxylic acid, ester, oxygen, phenyl benzene, polymer, sulfur

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

533.21

Energy Uncertainty:

Background Subtraction Method:

Linear

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.34

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Ag3d5 = 368.27

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

FAT mode. Emission angle = 45 degrees. Peak locations: Voigt function. The composition determined by XPS was C0.722O0.278. The relative intensity was 0.51.

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