NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Element:

tantalum

7440-25-7

element

Riffe D.M., Hale W., Kim B., Erskine J.L.

Journal:

Phys. Rev. B 51, 11012

DOI:

Pub Year:

1995

book All Records in this Publication

Data Type:

Surface Core-level Shift for the Second Layer of Atoms

Line Designation:

SS1-4f_7/2

Surface Core-Level Shift (eV) for the first Layer of Atoms:

0.72

Energy Uncertainty:

0.005

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.362

Lorentzian Width (eV):

0.140

Use of X-ray Monochromator:

Anode Material:

other source

X-ray Energy:

70, 100

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The sample was cleaned by repeated annealing to 2850 K. Peak locations: Doniach - Sunjic & Gaussian. Singularity index = 0.205.