NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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Te
TeO2
tellurium(IV) dioxide
7446-07-3
chalcogenide, oxide
Chowdari B.V.R., Kumari P.P.
J. Non-cryst. Solids 197, 31
Pub Year:
1996
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Photoelectron Line
3d5/2
576.10
Gaussian
Anode Material:
Mg
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
FAT mode.
amorphous, insulator
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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