NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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O

(Ag₂O)₀.₅₀(TeO₂)₀.₀₅(P₂O₅)₀.₄₅

bridging oxygen

disilver(I) oxide tellurium(IV) dioxide diphosphorus(V) pentoxide (bridging oxygen) ((Ag2O)0.50(TeO2)0.05(P2O5)0.45)

CAS Registry No:

chalcogenide, glass, oxide

Author Name(s):

Chowdari B.V.R., Kumari P.P.

J. Non-cryst. Solids 197, 31

Pub Year:

1996

book All Records in this Publication

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

533.10

Energy Uncertainty:

0.1

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Mg

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

The glass was prepared from the reagent grade AgNO3, TeO2 and NH4H2PO4. The intensity ratio of the non-bridging/bridging oxygen components was 0.53. FAT mode.

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