NIST X-ray Photoelectron Spectroscopy Database

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InSe

indium selenide

1312421

chalcogenide, II-VI semiconductor, III-V semiconductor, selenide

Photoelectron Line

4d_5/2

17.40

data

Yes

Anode Material:

other source

X-ray Energy:

Overall Energy Resolution (eV):

0.2

Calibration:

Charge Reference:

Valence band minimum

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The film with thickness of 480 nm was deposited on GaAs(100) substrate by PVD (T = 773 - 823 K). The spectra were recorded at normal emission.