NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Cd

CdS/CuInSe₂

cadmium sulfide/copper indium diselenide

CAS Registry No:

1306-23-6

chalcogenide, II-VI semiconductor, sulfide

Photoelectron Line

Line Designation:

4d

Binding Energy (eV):

11.25

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

other source

X-ray Energy:

21, 80

Overall Energy Resolution (eV):

0.3

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

1 - 4 A CdS/p-type CuInSe2(011) with a carrier concentration of 2E16 cm-3. The spectra were recorded at normal emission. The thickness was measured using a quartz-crystal thickness monitor.

crystal, semiconductor, thin film, vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction, X-ray Diffraction

Specimen Temperature (K):

300

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