NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Pt

H₂/Sn/Pt

hydrogen/tin/platinum

CAS Registry No:

7440-31-5

element

Author Name(s):

Janin E., Bjorkqvist M., Grehk T.M., Gothelid M., Pradier C.-M., et al.

Appl. Surf. Sci. 99, 371

Pub Year:

1996

book All Records in this Publication

Surface Core-level Shift

Line Designation:

SS-4f_7/2

Surface Core-Level Shift (eV):

-0.22

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

0.15

Lorentzian Width (eV):

0.44

Use of X-ray Monochromator:

Yes

Anode Material:

other source

X-ray Energy:

125

Overall Energy Resolution (eV):

Calibration:

FL = Fermi level

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

150 L H2/Pt(111)-(R3xR3)R30 degrees-Sn. The Sn coverage was ~1/3 ML. Singularity index = 0.12. The relative intensity was 0.26. The spectra were recorded at normal emission.

cooled, crystal, metal foil, surface coverage from 0ML to 1ML (0ML < coverage < 1ML), vapor deposited

Method of Determining Specimen Composition:

Method of Determining Specimen Crystallinity:

Low-energy Electron Diffraction

Specimen Temperature (K):

193

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