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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
W
Formula:
WS
2
Name:
tungsten disulfide
CAS Registry No:
12138-09-9
Class:
catalyst, chalcogenide, IV-VI semiconductor, sulfide
Author Name(s):
Xie X., McCarley R.E.
Journal:
Inorg. Chem. 34, 6124
DOI:
10.1021/ic00128a025
Pub Year:
1995
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
7/2
Binding Energy (eV):
32.90
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
data
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with one-point correction of energy scale
Comment:
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
X-ray Diffraction
Specimen Temperature (K):
300
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