NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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P

InP

indium phosphide

CAS Registry No:

22398-80-7

II-VI semiconductor, III-V semiconductor, phosphide

Author Name(s):

Baker S.H., Bayliss S.C., Gurman S.J., Elgun N., Davis E.A.

J. Phys. Cond. Matter 8, 1591

Pub Year:

1996

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Total Records: 2

Photoelectron Line

Line Designation:

2p

Binding Energy (eV):

127.50

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

data

Full Width at Half-maximum Intensity (eV):

1.8

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

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