NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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C

(^-CH₂C(CH₃)(C(O)OCH₃)^-)n

(^-C*(CH₃)(C(O)^-O^-CH₃)^-CH₂^-)n

poly(methyl methacrylate)

CAS Registry No:

9011-14-7

ester, oxygen, polymer, sulfur

Photoelectron Line

Line Designation:

1s

Binding Energy (eV):

285.60

Energy Uncertainty:

Background Subtraction Method:

Shirley

Peak Location Method:

mixed Gaussian/Lorentzian

Full Width at Half-maximum Intensity (eV):

1.17

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

Yes

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Internal hydrocarbon

Energy Scale Evaluation:

Reliable (reported energy within 300 eV of a reference energy)

Comment:

The C/O composition ratio determined by XPS was 2.46. The relative intensity is 0.197. FAT mode. An electron flood gun gun (Ep = 6 or 10 eV) and a Ni mesh were used for charge compensation. The intensity ratio of the Gaussian/Lorentzian components was 85/15.

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