NIST X-ray Photoelectron Spectroscopy Database

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SiNOx/(SiO₂⁺SiC)

interfacial zone

silicon nitride (oxygen doped)/(silicon dioxide+silicon carbide)

nitride, oxide

Guimon C., Gonbeau D., Guillouzo G.P., Dugne O., Guette A., Naslain R., Lahaye M.

Surf. Interface Anal. 16, 440

Pub Year:

1990

Photoelectron Line

398.50

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Charge Reference:

Adventitious carbon

Energy Scale Evaluation:

Reliable, with two-point correction of energy scale

Comment: