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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
F
Formula:
Cl,F in (ONO
2
)CHC(CH
2
ONO
2
)
2
CH(ONO
2
)
XPS Formula:
0
.
5
% wt coated by poly(vinyl chloride chlorotrifluoroethylene)
Name:
chloride, fluoride impurity in 1,3-bis(nitrooxy)-2,2-bis(nitrooxymethyl)-propane
CAS Registry No:
Class:
chloride, fluoride, nitro(so), nitrogen, oxygen
Author Name(s):
Worley C.M., Vannet M.D., Ball G.L., Moddeman W.E.
Journal:
Surf. Interface Anal. 10, 223
Pub Year:
1987
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
1s
Binding Energy (eV):
687.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Flood gun
Energy Scale Evaluation:
Comment:
Specimen:
powder (when a special point is made in the article)
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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