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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Si(C
2
H
5
)
3
OH
Name:
triethylhydroxysilane
CAS Registry No:
Class:
hydroxide, silane
Author Name(s):
Gray R.C., Carver J.C., Hercules D.M.
Journal:
J. Electron Spectrosc. Relat. Phenom. 8, 343
DOI:
10.1016/0368-2048(76)80021-7
Pub Year:
1976
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
101.10
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
Specimen:
vapor deposited
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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