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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
S
Formula:
Na(C
4
H
3
S)SO
3
XPS Formula:
Na(C
4
H
3
S*)SO
3
Name:
sodium 3-thiophenesulfonate
CAS Registry No:
Class:
alkali, sulfite, sulfur
Author Name(s):
Harker H., Sherwood P.M.A.
Journal:
Phil. Mag. 27, 1241
DOI:
10.1080/14786437308225832
Pub Year:
1973
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
163.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Internal hydrocarbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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