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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Si
2
O
3
/SiC
XPS Formula:
beta
-
SiC
Name:
disilicon trioxide/beta silicon carbide
CAS Registry No:
Class:
oxide
Author Name(s):
Wheeler D.R., Pepper S.V.
Journal:
Surf. Interface Anal. 10, 153
DOI:
10.1002/sia.740100216
Pub Year:
1987
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
2p
3/2
Binding Energy (eV):
102.10
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
None given
Energy Scale Evaluation:
Comment:
Specimen:
heated and cooled
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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