NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ge

(GeSe₂)₆₀(Tl₂Se)₄₀

(Ge*Se₂)₆₀(Tl₂Se)₄₀

germanium thallium selenide ((GeSe2)60(Tl2Se)40)

CAS Registry No:

chalcogenide, glass, IV-VI semiconductor, selenide

Author Name(s):

Sanghera J.S., Heo J., Mackenzie J.D.

J. Non-cryst. Solids 101, 8

Pub Year:

1988

book All Records in this Publication

Photoelectron Line

Line Designation:

3d

Binding Energy (eV):

31.10

Energy Uncertainty:

Background Subtraction Method:

other

Peak Location Method:

Gaussian

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

Al

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Other, C1s=284.44

Charge Reference:

Co-condensed hydrocarbon

Energy Scale Evaluation:

Reliable, with one-point correction of energy scale

Comment:

Samples were ground into a powder to obtain a fresh surface at the ambient atmosphere and then spread onto an In foil. Graphite powder was intentionally added onto the surface of the powder to act as an internal reference.

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