NIST X-ray Photoelectron Spectroscopy Database

NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0

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Ge

Ge

germanium

CAS Registry No:

7440-56-4

element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor

Author Name(s):

Ueno T.

Jpn J. Appl. Phys. 22, 1349

Pub Year:

1983

book All Records in this Publication

Photoelectron Line

Line Designation:

3d

Binding Energy (eV):

29.00

Energy Uncertainty:

Background Subtraction Method:

Peak Location Method:

Full Width at Half-maximum Intensity (eV):

Gaussian Width (eV):

Lorentzian Width (eV):

Use of X-ray Monochromator:

No

Anode Material:

X-ray Energy:

Overall Energy Resolution (eV):

Calibration:

Au

Charge Reference:

Conductor

Energy Scale Evaluation:

Reliable

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