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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ge
Formula:
Ge
2
Se
3
Name:
germanium(III) triselenide
CAS Registry No:
Class:
chalcogenide, IV-VI semiconductor, selenide
Author Name(s):
Ueno T.
Journal:
Jpn J. Appl. Phys. 22, 1349
Pub Year:
1983
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3d
Binding Energy (eV):
30.80
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
heated
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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