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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Sn
Formula:
Sn
Name:
tin
CAS Registry No:
7440-31-5
Class:
element
Author Name(s):
Hegde R. I.
Journal:
Surf. Interface Anal. 4, 205
DOI:
10.1002/sia.740040506
Pub Year:
1982
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3d
5/2
Binding Energy (eV):
485.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
AuCu
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
sputtered in argon
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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