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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Te
Formula:
Te
Name:
tellurium
CAS Registry No:
13494-80-9
Class:
element
Author Name(s):
Sarode P.R., Rao K.J., Hegd M.S., Rao C.N.R.
Journal:
J. Phys. C. 12, 4119
DOI:
10.1088/0022-3719/12/19/028
Pub Year:
1979
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
3s
Binding Energy (eV):
1006.00
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Charge Reference:
Conductor
Energy Scale Evaluation:
Comment:
Specimen:
crystal
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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