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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Hf
Formula:
HfO
2
Name:
hafnium(IV) oxide
CAS Registry No:
12055231
Class:
oxide
Author Name(s):
Morant C., Galan L., Sanz, J.M.
Journal:
Surf. Interface Anal. 16, 304
DOI:
10.1002/sia.740160163
Pub Year:
1990
book
All Records in this Publication
Data Type:
Photoelectron Line
Line Designation:
4f
7/2
Binding Energy (eV):
18.13
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Ag3d5=368.2
Charge Reference:
Conductor
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
annealed under O2
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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