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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Sn
Formula:
SnS
Name:
tin(II) sulfide
CAS Registry No:
1314950
Class:
chalcogenide, IV-VI semiconductor, sulfide
Author Name(s):
Wagner C.D.
Journal:
Discuss. Faraday Soc. 60, 291
DOI:
10.1039/DC9756000291
Pub Year:
1975
book
All Records in this Publication
Data Type:
Auger-Electron Line
Line Designation:
M
4
N
45
N
45
Kinetic Energy (eV):
435.70
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu
Charge Reference:
Adventitious carbon
Energy Scale Evaluation:
Reliable, with two-point correction of energy scale
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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