There was a problem with the connection!
menu
NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
Summary Page
One Page Summary
Instruction:
Click on selected Tab for more information.
General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ni
Formula:
Ni
Name:
nickel
CAS Registry No:
7440-02-0
Class:
element
Author Name(s):
Hillebrecht F.U., Fuggle J.C., Bennett P.A., Zolnierek Z.
Journal:
Phys. Rev. B 27, 2179
DOI:
10.1103/PhysRevB.27.2179
Pub Year:
1982
book
All Records in this Publication
Data Type:
Doublet Separation for Photoelectron Lines
Line Designation:
DS-2p
Double Separation (eV):
17.25
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
FL,Ni2p3=852.65
Charge Reference:
Energy Scale Evaluation:
Comment:
Specimen:
scraped
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
Go Back
Home
search
Identify Unknown Spectral Lines
search
Retrieve Data for Elements
keyboard_arrow_down
Selected Spectral Type and Element
Reference Data
search
Retrieve Data for Compounds
keyboard_arrow_down
Elemental Composition
Chemical Name
Chemical Classes
Data for One Element
assessment
Plots
keyboard_arrow_down
Wagner Plot
Chemical Shifts
search
Search Scientific Citations
assignment
More Options
keyboard_arrow_down
Introduction
Data Field Definitions
Citation
Contact
Version History
Acknowledgement
Disclaimer
An error has occurred. This application may no longer respond until reloaded.
Reload
🗙
