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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Te
Formula:
TeO
2
Name:
tellurium(IV) dioxide
CAS Registry No:
7446-07-3
Class:
chalcogenide, oxide
Author Name(s):
Bahl M.K., Watson R.L., Irgolic, K.J.
Journal:
J. Chem. Phys. 66, 5526
DOI:
10.1063/1.433874
Pub Year:
1977
book
All Records in this Publication
Data Type:
Doublet Separation for Photoelectron Lines
Line Designation:
DS-3p
Double Separation (eV):
51.20
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
vapor deposited
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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