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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
F
Formula:
NiF
2
Name:
nickel(II) difluoride
CAS Registry No:
10028189
Class:
fluoride
Author Name(s):
Wagner C.D., Riggs W.M., Davis L.E., Moulder J.F., Muilenberg G.E.
Journal:
Handbook of X-Ray Photoelectron Spectroscopy, Perkin-Elmer Corporation, Physical Electronics Division, Eden Prairie, Minn. 55344
Pub Year:
1979
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-1s, KL
23
L
23
(
1
D)
Auger Parameter (eV):
1340.50
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au,Cu
Charge Reference:
Energy Scale Evaluation:
Reliable
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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