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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Si
Formula:
Al
2
Mg(Si
4
O
10
)(OH)
2
CaNa.4H
2
O
Name:
bentonite
CAS Registry No:
Class:
alkali, alkaline earth, hydrate, mineral
Author Name(s):
Castle J.E., West R.H.
Journal:
J. Electron Spectrosc. Relat. Phenom. 18, 355
DOI:
10.1016/0368-2048(80)80024-7
Pub Year:
1980
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-2p, KL
23
L
23
(
1
D)
Auger Parameter (eV):
1712.10
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Si A2p-K=1716.0
Charge Reference:
Energy Scale Evaluation:
Comment:
Specimen:
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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