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NIST X-ray Photoelectron Spectroscopy Database (SRD 20), Version 5.0
Details Summary:
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General:
Citation
Data Processing:
Measurement:
Specimen:
Element:
Ge
Formula:
Ge
Name:
germanium
CAS Registry No:
7440-56-4
Class:
element, II-VI semiconductor, IV semiconductor, IV-VI semiconductor
Author Name(s):
Shalvoy R.B., Fisher G.B., Stiles P.J.
Journal:
Phys. Rev. B 15, 1680
DOI:
10.1103/PhysRevB.15.1680
Pub Year:
1977
book
All Records in this Publication
Data Type:
Auger Parameter
Line Designation:
AP-3d, L
3
M
45
M
45
(
1
G)
Auger Parameter (eV):
1174.40
Energy Uncertainty:
Background Subtraction Method:
Peak Location Method:
Full Width at Half-maximum Intensity (eV):
Gaussian Width (eV):
Lorentzian Width (eV):
Use of X-ray Monochromator:
No
Anode Material:
X-ray Energy:
Overall Energy Resolution (eV):
Calibration:
Au, Na1s-2p=1041.1
Charge Reference:
Energy Scale Evaluation:
Calibration study
Comment:
Specimen:
scraped
Method of Determining Specimen Composition:
Method of Determining Specimen Crystallinity:
Specimen Temperature (K):
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